VDI/VDE 5575 Blatt 2-2015
X-ray optical systems - Measurement methods - Measurement set-up and methods for the evaluation of X-ray optical systems

Standard No.

VDI/VDE 5575 Blatt 2-2015

Release Date

2015

Published By

Association of German Mechanical Engineers

Status

Be replaced

Replace By

VDI/VDE 5575 BLATT 2-2019

Latest

VDI/VDE 5575 BLATT 2-2019

Replace

VDI/VDE 5575 Blatt 2-2013

Scope

The standard describes the measurement set-up and methods to evaluate X-ray optical systems. Methods to characterise geometric properties of X-rays are described as well as approaches for their spectral analysis. Coordinate systems for non-ambiguous description of the measurement set-up are defined. Positioning and detector systems suitable for the different measurement tasks are specified. An overview of common X-ray sources is given. The typical properties of the different X-ray sources relevant for their measurement are described.

VDI/VDE 5575 Blatt 2-2015 Referenced Document

• DIN 5030-1:1985 Spectral measurement of radiation; terminology, quantities, characteristic values
• DIN 5030-3:1984 Spectral measurement of radiation; spectral isolation; definitions and characteristics
• DIN EN 12543-1:1999 Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 1: Scanning method; German version EN 12543-1:1999
• DIN EN 12543-2:2008 Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 2: Pinhole camera radiographic method; English version of DIN EN 12543-2:2008-10
• DIN EN 12543-5:1999 Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 5: Measurement of the effective focal spot size of mini and micro focus X-ray tubes; German version EN 12543-5:1999
• DIN EN ISO 11146-1:2005 Lasers and laser-related equipment - Test methods for laser beam widths, divergence angles and beam propagation ratios - Part 1: Stigmatic and simple astigmatic beams (ISO 11146-1:2005); German version EN ISO 11146-1:2005
• DIN EN ISO 15367-2:2005 Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 2: Shack-Hartmann sensors (ISO 15367-2:2005); German version EN ISO 15367-2:2005
• VDI 1000-2010 VDI Guideline Work - Principles and procedures
• VDI/VDE 5575 Blatt 1-2009 X-ray optical systems - Terms and definitions
• VDI/VDE 5575 Blatt 4-2011 X-ray optical systems - X-ray mirrors - Total reflection mirrors and multilayer mirrors
• VDI/VDE 5575 Blatt 8-2013 X-ray optical systems - Monochromator crystals

VDI/VDE 5575 Blatt 2-2015 history

• 2019 VDI/VDE 5575 BLATT 2-2019 X-ray optical systems - measurement methods; Measurement setup and methods for evaluating x-ray optical systems
• 2015 VDI/VDE 5575 Blatt 2-2015 X-ray optical systems - Measurement methods - Measurement set-up and methods for the evaluation of X-ray optical systems
• 2013 VDI/VDE 5575 Blatt 2-2013 Roentgenoptische Systeme - Messverfahren - Messaufbau und Methoden zur Bewertung roentgenoptischer Systeme