VDI/VDE 5575 Blatt 4-2011
X-ray optical systems - X-ray mirrors - Total reflection mirrors and multilayer mirrors

Standard No.
VDI/VDE 5575 Blatt 4-2011
Release Date
2011
Published By
Association of German Mechanical Engineers
Status
 2018-08
Replace By
VDI/VDE 5575 BLATT 4-2017
Latest
VDI/VDE 5575 BLATT 4-2018
Replace
VDI/VDE 5575 Blatt 4-2009
Scope
This guideline deals with reflective X-ray optical systems, which use total reflection as well as Bragg reflection on inner interfaces of a multilayer structure to influence the spectral composition and the directional characteristic. The physical principles and determining parameters of these X-ray mirrors are described. The role and influence of substrate and coatings are explained. Total reflection mirrors and multilayer mirrors for various applications are discussed. The most important X-ray optical systems using X-ray mirrors (Kirkpatrick-Baez, Wolter, Schwarzschild, Montel und EUVL optics) are introduced briefly.

VDI/VDE 5575 Blatt 4-2011 Referenced Document

VDI/VDE 5575 Blatt 4-2011 history

  • 2018 VDI/VDE 5575 BLATT 4-2018 Roentgenoptische Systeme - Roentgenspiegel und Roentgenspiegelsysteme - Totalreflexions- und Multischichtspiegel
  • 2017 VDI/VDE 5575 BLATT 4-2017 Roentgenoptische Systeme - Roentgenspiegel und Roentgenspiegelsysteme - Totalreflexions- und Multischichtspiegel
  • 2011 VDI/VDE 5575 Blatt 4-2011 X-ray optical systems - X-ray mirrors - Total reflection mirrors and multilayer mirrors
  • 2009 VDI/VDE 5575 Blatt 4-2009 X-ray optical systems - X-ray mirrors - Total reflection mirrors and multi layer mirrors
X-ray optical systems - X-ray mirrors - Total reflection mirrors and multilayer mirrors



Copyright ©2024 All Rights Reserved