GB/T 19501-2013
Microbeam analysis.General guide for electron backscatter diffraction analysis (English Version)

Standard No.

GB/T 19501-2013

Language

Chinese, Available in English version

Release Date

2013

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 19501-2013

Replace

GB/T 19501-2004

Scope

This standard specifies the electron backscatter diffraction analysis method. This standard applies to the analysis of phase identification, crystal orientation, microstructure and grain boundary characteristics of scanning electron microscope and electron probe installed with electron backscatter diffraction accessories.

GB/T 19501-2013 Referenced Document

• GB/T 15074 General guide of quantitative analysis by EPMA
• GB/T 27025 General requirements for the competence of testing and calibration laboratories*， 2019-12-10 Update
• ISO 24173 Microbeam analysis*， 2024-01-01 Update

GB/T 19501-2013 history

• 2013 GB/T 19501-2013 Microbeam analysis.General guide for electron backscatter diffraction analysis
• 2004 GB/T 19501-2004 General guide for electron backscatter diffraction analysis