This standard specifies the electron backscatter diffraction analysis method. This standard is applicable to the analysis of phase identification, crystal orientation, microstructure and grain boundary characteristics of electron beam microanalyzer installed with electron backscattered diffraction accessory.
GB/T 19501-2004 history
2013GB/T 19501-2013 Microbeam analysis.General guide for electron backscatter diffraction analysis
2004GB/T 19501-2004 General guide for electron backscatter diffraction analysis