SAE J2052-2011
Test Device Head Contact Duration Analysis

Standard No.

SAE J2052-2011

Release Date

2011

Published By

Society of Automotive Engineers (SAE)

Status

Be replaced 2016-07

Replace By

SAE J2052-2016

Latest

SAE J2052-2016

Scope

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers. The purpose of this SAE Information Report is to describe a computer-adaptable technique for determining head engagement and disengagement times for use in the calculation of the HIC without reliance on contact switches or photography.

SAE J2052-2011 history

• 2016 SAE J2052-2016 Test Device Head Contact Duration Analysis
• 2011 SAE J2052-2011 Test Device Head Contact Duration Analysis
• 2005 SAE J2052-2005 Test Device Head Contact Duration Analysis
• 1997 SAE J2052-1997 Test Device Head Contact Duration Analysis
• 1990 SAE J2052-1990 Test Device Head Contact Duration Analysis@ Information Report