SAE J2052-2016
Test Device Head Contact Duration Analysis
- Standard No.
- SAE J2052-2016
- Release Date
- 2016
- Published By
- SAE - SAE International
- Latest
- SAE J2052-2016
- Scope
- This methodology can be used for all calculations of HIC@ with all test devices having an upper neck triaxial load cell mounted rigidly to the head@ and head triaxial accelerometers. Purpose The purpose of this SAE Information Report is to describe a computer-adaptable technique for determining head engagement and disengagement times for use in the calculation of the HIC without reliance on contact switches or photography.
SAE J2052-2016 history
- 2016 SAE J2052-2016 Test Device Head Contact Duration Analysis
- 2011 SAE J2052-2011 Test Device Head Contact Duration Analysis
- 2005 SAE J2052-2005 Test Device Head Contact Duration Analysis
- 1997 SAE J2052-1997 Test Device Head Contact Duration Analysis
- 1990 SAE J2052-1990 Test Device Head Contact Duration Analysis@ Information Report
