SAE J2052-1997
Test Device Head Contact Duration Analysis

Standard No.

SAE J2052-1997

Release Date

1997

Published By

Society of Automotive Engineers (SAE)

Status

Be replaced

Replace By

SAE J2052-2005

Latest

SAE J2052-2016

Scope

This methodology can be used for all calculations of HIC, with all test head, and head triaxial accelerometers. The purpose of this SAE Information Report is to describe a computer-adaptable technique for determining head engagement and disengagement times for use in the calculation of the HIC without reliance on contact switches or photography.

SAE J2052-1997 history

• 2016 SAE J2052-2016 Test Device Head Contact Duration Analysis
• 2011 SAE J2052-2011 Test Device Head Contact Duration Analysis
• 2005 SAE J2052-2005 Test Device Head Contact Duration Analysis
• 1997 SAE J2052-1997 Test Device Head Contact Duration Analysis
• 1990 SAE J2052-1990 Test Device Head Contact Duration Analysis@ Information Report