GB/T 22319.8-2008
Measurement of quartz crystal unit parameters.Part 8:Test fixture for surface mounted quartz crystal units (English Version)

Standard No.

GB/T 22319.8-2008

Language

Chinese, Available in English version

Release Date

2008

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 22319.8-2008

Scope

This part of GB/T 22319 specifies the measurement fixtures that can accurately measure the resonant frequency, resonant resistance and equivalent circuit parameters of leadless surface mount quartz crystal components. The measurement methods adopt IEC 60444-4-1988 and IEC 60444-5- Zero phase technology specified in 1995. See the following clauses for the equivalent circuit and applicable frequency range using this measurement fixture. In addition, this section also applies to leadless crystal element enclosures in IEC 61240-1994. The equivalent circuit and electrical parameters of the measuring fixture are based on IEC 60444-1-1986 and IEC 60444-4-1988. The load capacitance range is 10pF or higher. This part also specifies the calibration of the measuring system and C-chip. This part is applicable to measuring fixtures that can accurately measure the resonant frequency, resonant resistance, parallel capacitance C, dynamic capacitance C and dynamic inductance L of quartz crystal components. The frequency range is 1MHz to 150MHz. Network Analyzer.

GB/T 22319.8-2008 Referenced Document

• IEC 60444-1:1986 Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 1: basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network
• IEC 60444-2:1980 Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 2 : phase offset method for measurement of motional capacitance of quartz crystal units
• IEC 60444-5:1995 Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
• IEC 61240:1994 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - Genral rules

GB/T 22319.8-2008 history

• 2008 GB/T 22319.8-2008 Measurement of quartz crystal unit parameters.Part 8:Test fixture for surface mounted quartz crystal units

GB/T 22319.8-2008 -All Parts