IEC 60444-2:1980
Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 2 : phase offset method for measurement of motional capacitance of quartz crystal units

Standard No.

IEC 60444-2:1980

Release Date

1980

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 60444-2:1980

Scope

Describes a method suitable for measurement in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5 %. This method is based on the phase measurement at the resonance frequency and in its vicinity. The value of the motiona

IEC 60444-2:1980 history

• 1980 IEC 60444-2:1980 Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 2 : phase offset method for measurement of motional capacitance of quartz crystal units