IEC 60444-1:1986
Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 1: basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network
- Standard No.
- IEC 60444-1:1986
- Release Date
- 1986
- Published By
- International Electrotechnical Commission (IEC)
- Status
- 2008-01
- Replace By
- IEC 60444-1:1986/AMD1:1999
- Latest
- IEC 60444-1:1986/AMD1:1999
- Scope
- Specifies a simple method of measurement and describes a suitable measuring network. Measuring method and network are suitable for use over the frequency range 1 MHz to 200 MHz. The measuring circuit consists basically of a
-network connected with co
IEC 60444-1:1986 history
- 1999 IEC 60444-1:1986/AMD1:1999 Measurement of quartz crystal unit parameters by zero phase technique in a
-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network; Amendment - 1986 IEC 60444-1:1986 Measurement of quartz crystal unit parameters by zero phase technique in a
-network; part 1: basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network
