IEC 60444-1:1986/AMD1:1999
Measurement of quartz crystal unit parameters by zero phase technique in a -network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network; Amendment
- Standard No.
- IEC 60444-1:1986/AMD1:1999
- Release Date
- 1999
- Published By
- International Electrotechnical Commission (IEC)
- Latest
- IEC 60444-1:1986/AMD1:1999
- Replace
- IEC 49/442/FDIS:1999
- Scope
- This is Amendment 1 to IEC 60444-1-1986 (Measurement of quartz crystal unit parameters by zero phase technique in a pi-network Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network)
IEC 60444-1:1986/AMD1:1999 history
- 1999 IEC 60444-1:1986/AMD1:1999 Measurement of quartz crystal unit parameters by zero phase technique in a
-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network; Amendment - 1986 IEC 60444-1:1986 Measurement of quartz crystal unit parameters by zero phase technique in a
-network; part 1: basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network
