IEC 61000-4-20:2003
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques; Emission and immunity testing in transverse electromagnetic (TEM) waveguides

Standard No.

IEC 61000-4-20:2003

Release Date

2003

Published By

International Electrotechnical Commission (IEC)

Status

Withdraw

Replace By

IEC 61000-4-20:2003/AMD1:2006

Latest

IEC 61000-4-20:2022

Scope

Relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. This includes open (for example, striplines and EMP simulators) and closed (for example, TEM cells)

IEC 61000-4-20:2003 history

• 2022 IEC 61000-4-20:2022 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 2010 IEC 61000-4-20:2010 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 2007 IEC 61000-4-20:2007 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 1970 IEC 61000-4-20:2003/AMD1:2006 Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 2003 IEC 61000-4-20:2003 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques; Emission and immunity testing in transverse electromagnetic (TEM) waveguides