IEC 61000-4-20:2003/AMD1:2006
Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

Standard No.

IEC 61000-4-20:2003/AMD1:2006

Release Date

1970

Published By

SCC

Status

Be replaced

Replace By

IEC 61000-4-20:2007

Latest

IEC 61000-4-20:2022

Replace

2006-11-15

IEC 61000-4-20:2003/AMD1:2006 history

• 2022 IEC 61000-4-20:2022 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 2010 IEC 61000-4-20:2010 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 2007 IEC 61000-4-20:2007 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 1970 IEC 61000-4-20:2003/AMD1:2006 Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 2003 IEC 61000-4-20:2003 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques; Emission and immunity testing in transverse electromagnetic (TEM) waveguides