IEC 61000-4-20:2007
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

Standard No.

IEC 61000-4-20:2007

Release Date

2007

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced 2010-09

Replace By

IEC 61000-4-20:2010

Latest

IEC 61000-4-20:2022

Scope

This part of IEC 61000 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. This includes open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type.

IEC 61000-4-20:2007 history

• 2022 IEC 61000-4-20:2022 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 2010 IEC 61000-4-20:2010 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 2007 IEC 61000-4-20:2007 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 1970 IEC 61000-4-20:2003/AMD1:2006 Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 2003 IEC 61000-4-20:2003 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques; Emission and immunity testing in transverse electromagnetic (TEM) waveguides