GB/T 11093-2007 (English Version) PDF

Standard No.: GB/T 11093-2007
Language: Chinese, Available in English version
Release Date: 2007
Published By: General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest: GB/T 11093-2007
Replace: GB/T 11093-1989

Scope: This standard specifies the requirements, test methods, inspection rules and signs, packaging, transportation and storage of liquid-sealed Czochralski gallium arsenide single crystals and cut slices. This standard applies to gallium arsenide single crystals and their cut pieces prepared by the liquid-encapsulated Czochralski method. The products are used for making microwave devices, integrated circuits, optoelectronic devices, sensing elements and infrared windows and other components.

GB/T 11093-2007 Referenced Document

GB/T 13387 Test method for measuring flat length wafers of silicon and other electronic materials*， 2009-10-30 Update
GB/T 14264 Semiconductor materials-Terms and definitions *， 2009-10-30 Update
GB/T 14844 Designations of semiconductor materials*， 2018-12-28 Update
GB/T 1555 Method for Determination of Crystalline Orientation of Semiconductor Single Crystal*， 2023-08-06 Update
GB/T 2828.1 Inspection procedure by count sampling part 1: Lot by lot inspection sampling plan retrieved by acceptance quality limit (AQL)*， 2013-02-15 Update
GB/T 4326 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient
GB/T 8760 Test method for dislocation density of monocrystal gallium arsenide*， 2020-09-29 Update
GJB 1927 Gallium arsenide single crystal material testing method

2007 GB/T 11093-2007 Liquid encapsulated czochralski-grown gallium arsenide single crystals and as-cut slices
1989 GB/T 11093-1989 Liquid encapaulated czochralski-grouwn gallium arsenide single crystals and As-cut slices