IEC 61000-4-20/AMD1:2006
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides; Amendment 1

Standard No.

IEC 61000-4-20/AMD1:2006

Release Date

2006

Published By

International Electrotechnical Commission (IEC)

Status

Withdraw

Replace By

IEC 61000-4-20:2007

Latest

IEC 61000-4-20:2022

Replace

IEC 77B/520/FDIS:2006

Scope

This standard is about Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides; Amendment 1

IEC 61000-4-20/AMD1:2006 history

• 2022 IEC 61000-4-20:2022 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 2010 IEC 61000-4-20:2010 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 2007 IEC 61000-4-20:2007 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 1970 IEC 61000-4-20:2003/AMD1:2006 Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 2003 IEC 61000-4-20:2003 Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques; Emission and immunity testing in transverse electromagnetic (TEM) waveguides