IEC 60747-6:1983
Semiconductor devices. Discrete devices. Part 6 : Thyristors

Standard No.

IEC 60747-6:1983

Release Date

1983

Published By

International Electrotechnical Commission (IEC)

Status

Withdraw

Replace By

IEC 60747-6/AMD1:1991

Latest

IEC 60747-6:2016

Replace

IEC 60147-1G:1975 IEC 60147-0:1966 IEC 60147-0B:1969 IEC 60147-0C:1973 IEC 60147-0F:1982 IEC 60147-1:1972 IEC 60147-1F:1973 IEC 60147-1H:1981 IEC 60147-1J:1981 IEC 60147-2:1963 IEC 60147-2B:1970 IEC 60147-2C:1970 IEC 60147-2F:1974 IEC 60147-2K:1978 IEC 60

IEC 60747-6:1983 history

• 2016 IEC 60747-6:2016 Semiconductor devices - Part 6: Thyristors
• 2000 IEC 60747-6:2000 Semiconductor devices - Part 6: Thyristors
• 1994 IEC 60747-6/AMD2:1994 Semiconductor devices; discrete devices and integrated circuits; part 6: thyristors; amendment 2
• 1991 IEC 60747-6/AMD1:1991 Semiconductor devices; discrete devices and integrated circuits; part 6: thyristors; amendment 1
• 1983 IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors

IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors has been changed from IEC 60147-1G:1975 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 1 : Essential ratings and characteristics..

IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors has been changed from IEC 60147-0:1966 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 0: General and terminology.

IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors has been changed from IEC 60147-0B:1969 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 0: General and terminolgy.

IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors has been changed from IEC 60147-0C:1973 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 0: General and terminology.

IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors has been changed from IEC 60147-1:1972 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 1 : Essential ratings and characteristics.

IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors has been changed from IEC 60147-1F:1973 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 1 : Essential ratings and characteristics..

IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors has been changed from IEC 60147-1J:1981 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 1 : Essential ratings and characteristics..

IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors has been changed from IEC 60147-2:1963 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods.

IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors has been changed from IEC 60147-2B:1970 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods..

IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors has been changed from IEC 60147-2C:1970 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods..

IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors has been changed from IEC 60147-2F:1974 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods..

IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors has been changed from IEC 60147-2K:1978 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods..