IEC 60147-0C:1973
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 0: General and terminology

Standard No.

IEC 60147-0C:1973

Release Date

1973

Published By

International Electrotechnical Commission (IEC)

Status

Withdraw

Latest

IEC 60147-0C:1973

Replace By

IEC 60747-2:1983 IEC 60747-1:1983 IEC 60747-6:1983

IEC 60147-0C:1973 history

• 1966 IEC 60147-0:1966 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 0: General and terminology

IEC 60147-0C:1973 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 0: General and terminology was changed to IEC 60747-2:1983 Semiconductor devices. Discrete devices. Part 2 : Rectifier diodes.

IEC 60147-0C:1973 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 0: General and terminology was changed to IEC 60747-1:1983 Semiconductor devices. Discrete devices. Part 1 : General.

IEC 60147-0C:1973 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 0: General and terminology was changed to IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors.