IEC 60147-1F:1973
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 1 : Essential ratings and characteristics.

Standard No.

IEC 60147-1F:1973

Release Date

1973

Published By

International Electrotechnical Commission (IEC)

Status

Withdraw

Latest

IEC 60147-1F:1973

Replace By

IEC 60747-2:1983 IEC 60747-1:1983 IEC 60747-6:1983

IEC 60147-1F:1973 history

• 1972 IEC 60147-1:1972 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 1 : Essential ratings and characteristics

IEC 60147-1F:1973 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 1 : Essential ratings and characteristics. was changed to IEC 60747-2:1983 Semiconductor devices. Discrete devices. Part 2 : Rectifier diodes.

IEC 60147-1F:1973 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 1 : Essential ratings and characteristics. was changed to IEC 60747-1:1983 Semiconductor devices. Discrete devices. Part 1 : General.

IEC 60147-1F:1973 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 1 : Essential ratings and characteristics. was changed to IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors.