- Standard No.
- SJ/T 2658.12-2015
- Language
- Chinese, Available in English version
- Release Date
- 2015
- Published By
- Professional Standard - Electron
- Latest
-
SJ/T 2658.12-2015
- Replace
-
SJ 2658.12-1986
- Scope
- This part specifies the measurement principle diagram, measurement steps and specified conditions for the peak emission wavelength and spectral radiation bandwidth of semiconductor infrared emitting diodes (hereinafter referred to as devices). This section applies to semiconductor infrared emitting diodes.
SJ/T 2658.12-2015 Referenced Document
- SJ/T 2658.1 Measuring method for semiconductor infrared-emitting diode.Part 1: General
SJ/T 2658.12-2015 history
- 2015 SJ/T 2658.12-2015 Measuring method for semiconductor infrared-emitting diode.Part 12: Peak-emission wavelength and spectral radiant bandwidth
- 1970 SJ 2658.12-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for peak emission wavelength and spectral half width
SJ/T 2658.12-2015 Measuring method for semiconductor infrared-emitting diode.Part 12: Peak-emission wavelength and spectral radiant bandwidth has been changed from SJ 2658.12-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for peak emission wavelength and spectral half width.