- Standard No.
- SJ/T 2658.1-2015
- Language
- Chinese, Available in English version
- Release Date
- 2015
- Published By
- Professional Standard - Electron
- Latest
-
SJ/T 2658.1-2015
- Replace
-
SJ 2658.1-1986
- Scope
- This part specifies the general requirements for photoelectric parameter measurement of semiconductor infrared emitting diodes (hereinafter referred to as devices), including the error range of the test instrument, the performance requirements of the power supply, and the test environmental conditions. This section applies to semiconductor infrared emitting diodes.
SJ/T 2658.1-2015 history
- 2015 SJ/T 2658.1-2015 Measuring method for semiconductor infrared-emitting diode.Part 1: General
- 1970 SJ 2658.1-1986 Methods of measurement for semiconductor infrared diodes General rules
SJ/T 2658.1-2015 Measuring method for semiconductor infrared-emitting diode.Part 1: General has been changed from SJ 2658.1-1986 Methods of measurement for semiconductor infrared diodes General rules.