GB/T 26068-2018
Measurement of Carrier Recombination Lifetime of Silicon Wafer and Ingot Non-contact Microwave Reflection Photoconductivity Decay Method (English Version)

Standard No.

GB/T 26068-2018

Language

Chinese, Available in English version

Release Date

2019

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 26068-2018

Replace

GB/T 26068-2010

GB/T 26068-2018 history

• 2019 GB/T 26068-2018 Measurement of Carrier Recombination Lifetime of Silicon Wafer and Ingot Non-contact Microwave Reflection Photoconductivity Decay Method
• 2011 GB/T 26068-2010 Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance