GB/T 4377-2018
Semiconductor integrated circuits.Measuring method of voltage regulators (English Version)

Standard No.

GB/T 4377-2018

Language

Chinese, Available in English version

Release Date

2018

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 4377-2018

Replace

GB/T 4377-1996

Scope

This standard specifies the parameter test methods of voltage regulators (hereinafter referred to as devices). This standard applies to the testing of voltage regulator parameters in the field of semiconductor integrated circuits.

GB/T 4377-2018 history

• 2018 GB/T 4377-2018 Semiconductor integrated circuits.Measuring method of voltage regulators
• 1996 GB/T 4377-1996 Semiconductor integrated circuits. General principles of measuring methods of voltage regulator
• 0000 GB 4377-1984