GB/T 4377-1996
Semiconductor integrated circuits. General principles of measuring methods of voltage regulator (English Version)

Standard No.

GB/T 4377-1996

Language

Chinese, Available in English version

Release Date

1996

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Status

Be replaced 2018-08

Replace By

GB/T 4377-2018

Latest

GB/T 4377-2018

Replace

GB 4377-1984

Scope

This standard specifies the basic principles of the electrical characteristic test methods for semiconductor integrated circuit voltage regulators (hereinafter referred to as devices). This standard applies to the testing of the electrical characteristics of semiconductor integrated circuit voltage regulators, not to double-terminal (single-port) devices.

GB/T 4377-1996 history

• 2018 GB/T 4377-2018 Semiconductor integrated circuits.Measuring method of voltage regulators
• 1996 GB/T 4377-1996 Semiconductor integrated circuits. General principles of measuring methods of voltage regulator
• 0000 GB 4377-1984