VDI/VDE/DGQ 2618 Blatt 4.4-2009 Inspection of measuring and test equipment - Test instruction for reference gauges with plane-parallel or spherical measuring faces and for spherical-end gauges and internal callipers
This part of the guideline applies to the testing of spherical-end gauges and internal callipers as well as for reference gauges whose measuring faces either are plane-parallel, or represent segments of a joint spherical or cylindrical surface, or have one plane and one spherical measuring face (preferably for the adjustment of micrometers). The necessary working sequences are described.
DIN 876-1:1984 Surface plates; natural hard rock surface plates; requirements and testing
DIN EN ISO 3650:1999 Geometrical product specifications (GPS) - Length standards - Gauge blocks (ISO 3650:1998); German version EN ISO 3650:1998
DIN ISO 286-1:1990 ISO system of limits and fits; bases of tolerances, deviations and fits; identical with ISO 286-1:1988
DIN ISO 286-2:1990 ISO system of limits and fits; tables of standard tolerance grades and limit deviations for holes and shafts; identical with ISO 286-2:1988
ISO 286-2:1988 ISO system of limits and fits; part 2: tables of standard tolerance grades and limit deviations for holes and shafts
VDI 1000-2006 Richtlinienarbeit - Grundsaetze und Anleitungen
VDI/VDE/DGQ 2618 Blatt 1.1-2001 Inspection of measuring and test equipment - Instructions to inspect measuring and test equipment for geometrical quantities - Basic principals
VDI/VDE/DGQ 2618 Blatt 1.2-2003 Inspection of measuring and test equipment - Instructions for the inspection of measuring and test equipment for geometrical quantities - Uncertainty of measurement
VDI/VDE/DGQ 2618 Blatt 4.4-2009 history
2009VDI/VDE/DGQ 2618 Blatt 4.4-2009 Inspection of measuring and test equipment - Test instruction for reference gauges with plane-parallel or spherical measuring faces and for spherical-end gauges and internal callipers
2006VDI/VDE/DGQ 2618 Blatt 4.4-2006 Inspection of measuring and test equipment - Test instruction for setting standards for micrometers