GB/T 4589.1-1989
Semiconductor devices!*Generic specification for discrete devices and integrated circuits (English Version)
- Standard No.
- GB/T 4589.1-1989
- Language
- Chinese, Available in English version
- Release Date
- 1989
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Status
- 2007-02
- Replace By
- GB/T 4589.1-2006
- Latest
- GB/T 4589.1-2006
- Scope
- This specification is applicable to semiconductor integrated circuits (hereinafter referred to as devices), which specifies the general procedures for quality assessment of devices, and gives the general principles to be followed in the following tests and tests: Electrical characteristic test; Climate and mechanical test; Durability test. The blank detail specification is a supplement to this specification. For a particular type of device, its detailed specification and this specification constitute the complete requirements for the quality of the device.
GB/T 4589.1-1989 history
- 2006 GB/T 4589.1-2006 Semiconductor devices. Part 10: Generic specification for discrete devices and integrated circuits
- 1989 GB/T 4589.1-1989 Semiconductor devices!*Generic specification for discrete devices and integrated circuits
