GB/T 4589.1-2006
Semiconductor devices. Part 10: Generic specification for discrete devices and integrated circuits (English Version)
- Standard No.
- GB/T 4589.1-2006
- Language
- Chinese, Available in English version
- Release Date
- 2006
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Latest
- GB/T 4589.1-2006
- Replace
- GB/T 4589.1-1989
- Scope
- This specification forms part of the International Electrotechnical Commission Electronic Component Quality Assessment System (IECQ). This specification is a general specification for semiconductor devices (discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits). This specification specifies the general procedure for quality assessment to be used within the IECQ system and gives general principles for: - test methods for electrical characteristics; - climatic and mechanical tests; - durability tests.
GB/T 4589.1-2006 history
- 2006 GB/T 4589.1-2006 Semiconductor devices. Part 10: Generic specification for discrete devices and integrated circuits
- 1989 GB/T 4589.1-1989 Semiconductor devices!*Generic specification for discrete devices and integrated circuits
