KS C IEC 60444-2:2002
Measurement of quartz crystal unit parameters by zero phase technique in a p-network－Part 2：Phase offset method for measurement of motional capacitance of quartz crystal units

Standard No.

KS C IEC 60444-2:2002

Release Date

2002

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS C IEC 60444-2-2002(2017)

Latest

KS C IEC 60444-2-2022

Scope

This standard specifies the accuracy of crystal units in the frequency range 1 to 125 MHz with a total measurement error of the order of 5 %.

KS C IEC 60444-2:2002 history

• 2022 KS C IEC 60444-2-2022 Measurement of quartz crystal unit parameters by zero phase technique in a p-network－Part 2：Phase offset method for measurement of motional capacitance of quartz crystal units
• 0000 KS C IEC 60444-2-2002(2017)
• 2002 KS C IEC 60444-2:2002 Measurement of quartz crystal unit parameters by zero phase technique in a p-network－Part 2：Phase offset method for measurement of motional capacitance of quartz crystal units