KS C IEC 60444-2-2002(2017)
Measurement of quartz crystal unit parameters by zero phase technique in a p-network－Part 2：Phase offset method for measurement of motional capacitance of quartz crystal units

Standard No.

KS C IEC 60444-2-2002(2017)

Release Date

2002

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS C IEC 60444-2-2002(2022)

Latest

KS C IEC 60444-2-2002(2022)

KS C IEC 60444-2-2002(2017) history

• 0000 KS C IEC 60444-2-2002(2022)
• 0000 KS C IEC 60444-2-2002(2017)
• 2002 KS C IEC 60444-2:2002 Measurement of quartz crystal unit parameters by zero phase technique in a p-network－Part 2：Phase offset method for measurement of motional capacitance of quartz crystal units