DS/EN 60749-27/A1:2013
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Standard No.

DS/EN 60749-27/A1:2013

Release Date

2013

Published By

Danish Standards Foundation

Latest

DS/EN 60749-27/A1:2013

Scope

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test

DS/EN 60749-27/A1:2013 history

• 2013 DS/EN 60749-27/A1:2013 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
• 2006 DS/EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)