DS/EN 60749-27:2006
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Standard No.

DS/EN 60749-27:2006

Release Date

2006

Published By

Danish Standards Foundation

Status

Be replaced 2013-01

Replace By

DS/EN 60749-27/A1:2013

Latest

DS/EN 60749-27/A1:2013

Scope

This part of 60749 establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed.

DS/EN 60749-27:2006 history

• 2013 DS/EN 60749-27/A1:2013 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
• 2006 DS/EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)