IEC 61326-2-1:2012
Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected

Standard No.

IEC 61326-2-1:2012

Release Date

2012

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced

Replace By

IEC 61326-2-1:2020 RLV

Latest

IEC 61326-2-1:2020 RLV

Replace

IEC 65A/641/FDIS:2012 IEC 61326-2-1:2005

Scope

In addition to the scope of IEC 61326-1@ this part of IEC 61326 specifies more detailed test configurations@ operational conditions and performance criteria for equipment with test and measurement circuits (both internal and/or external to the equipment) that are not EMC protected for operational and/or functional reasons@ as specified by the manufacturer. The manufacturer specifies the environment for which the product is intended to be used and selects the appropriate test level specifications of IEC 61326-1. NOTE Examples of equipment include@ but are not limited to@ oscilloscopes@ logic analysers@ spectrum analysers@ network analysers@ analogue instruments@ digital multimeters (DMM) and board test systems.

IEC 61326-2-1:2012 history

• 0000 IEC 61326-2-1:2020 RLV
• 2012 IEC 61326-2-1:2012 Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected
• 2005 IEC 61326-2-1:2005 Electrical equipment for measurement, control and laboratory use, control and laboratory use - EMC requirements - Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement e