IEC 61326-2-1:2005
Electrical equipment for measurement, control and laboratory use, control and laboratory use - EMC requirements - Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement e
- Standard No.
- IEC 61326-2-1:2005
- Release Date
- 2005
- Published By
- International Electrotechnical Commission (IEC)
- Status
- 2012-10
- Replace By
- IEC 61326-2-1:2012
- Latest
- IEC 61326-2-1:2020 RLV
- Scope
- In addition to the scope of IEC 61326-1, this part of IEC 61326 specifies more detailed test configurations, operational conditions and performance criteria for equipment with test and measurement circuits (both internal and/or external to the equipment) that are not EMC protected for operational and/or functional reasons, as specified by the manufacturer. The manufacturer specifies the environment for which the product is intended to be used and/or selects the appropriate test level specifications of IEC 61326-1. NOTE Examples of equipment include, but are not limited to, oscilloscopes, logic analysers, spectrum analysers, network analysers, digital multimeters (DMM) and board test systems.
IEC 61326-2-1:2005 history
- 0000 IEC 61326-2-1:2020 RLV
- 2012 IEC 61326-2-1:2012 Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected
- 2005 IEC 61326-2-1:2005 Electrical equipment for measurement, control and laboratory use, control and laboratory use - EMC requirements - Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement e
