IEC 62276:2012
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Standard No.

IEC 62276:2012

Release Date

2012

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced 2016-11

Replace By

IEC 62276:2016

Latest

IEC 62276:2016

Replace

IEC 49/1005/FDIS:2012 IEC 62276:2005

Scope

This International Standard applies to the manufacture of synthetic quartz@ lithium niobate (LN)@ lithium tantalate (LT)@ lithium tetraborate (LBO)@ and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.

IEC 62276:2012 history

• 2016 IEC 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
• 2012 IEC 62276:2012 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
• 2005 IEC 62276:2005 Single crystal wafers for surface acoustic wave (SAW) device application - Specifications and measuring methods