IEC 62276:2005
Single crystal wafers for surface acoustic wave (SAW) device application - Specifications and measuring methods

Standard No.

IEC 62276:2005

Release Date

2005

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced 2016-11

Replace By

IEC 62276:2012

Latest

IEC 62276:2016

Scope

This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.

IEC 62276:2005 history

• 2016 IEC 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
• 2012 IEC 62276:2012 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
• 2005 IEC 62276:2005 Single crystal wafers for surface acoustic wave (SAW) device application - Specifications and measuring methods