DS/EN 60749-6:2003
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

Standard No.

DS/EN 60749-6:2003

Release Date

2003

Published By

Danish Standards Foundation

Status

Be replaced 2003-12

Replace By

DS/EN 60749-6/Corr.1:2004

Latest

DS/EN 60749-6/Corr.1:2004

Scope

The purpose of this part of IEC 60749 is to test and determine the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive but should preferably be used for device qualification. If such devices are used for delivery, the effects of this highly accelerated stress test must be evaluated.

DS/EN 60749-6:2003 history

• 2004 DS/EN 60749-6/Corr.1:2004 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
• 2003 DS/EN 60749-6:2003 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature