DS/EN 60749-6/Corr.1:2004
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

Standard No.

DS/EN 60749-6/Corr.1:2004

Release Date

2004

Published By

Danish Standards Foundation

Status

Withdraw

Latest

DS/EN 60749-6/Corr.1:2004

Replace By

SAE AS 81306/2A-2014

Scope

The purpose of this part of IEC 60749 is to test and determine the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive but should preferably be used for device qualification. If such devices are used for delivery, the effects of this highly accelerated stress test must be evaluated.

DS/EN 60749-6/Corr.1:2004 history

• 2004 DS/EN 60749-6/Corr.1:2004 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
• 2003 DS/EN 60749-6:2003 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature