This part of IEC 60749 establishes a standard procedure for determining the solderability of
device package terminations that are intended to be joined to another surface using tin-lead
(SnPb) or lead-free (Pb-free) solder for the attachment.
This test method provides a procedure for ‘dip and look’ solderability testing of through hole,
axial and surface mount devices (SMDs) as well as an optional procedure for a board
mounting solderability test for SMDs for the purpose of allowing simulation of the soldering
process to be used in the device application. The test method also provides optional
conditions for ageing.
This test is considered destructive unless otherwise detailed in the relevant specification.
NOTE 1 This test method is in general accord with IEC 60068, but due to specific requirements of semiconductors,
the following text is applied.
NOTE 2 This test method does not assess the effect of thermal stresses which may occur during the soldering
process. Reference should be made IEC 60749-15 or IEC 60749-20.
BS EN 60749-21:2011 history
2011BS EN 60749-21:2011 Semiconductor devices. Mechanical and climatic test methods. Solderability
2005BS EN 60749-21:2005 Semiconductor devices - Mechanical and climatic test methods - Solderability