BS EN 62374:2008
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Standard No.

BS EN 62374:2008

Release Date

2008

Published By

British Standards Institution (BSI)

Status

Withdraw

Latest

BS EN 62374:2008

Replace

04/30113827 DC-2004

BS EN 62374:2008 history

• 2008 BS EN 62374:2008 Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
• 2008 BS EN 62374:2007 Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films