IEC 62132-2:2010
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
- Standard No.
- IEC 62132-2:2010
- Release Date
- 2010
- Published By
- International Electrotechnical Commission (IEC)
- Latest
- IEC 62132-2:2010
- Replace
- IEC 47A/838/FDIS:2010
- Scope
- This International Standard specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.
IEC 62132-2:2010 Referenced Document
- IEC 60050-131:2002 International Electrotechnical Vocabulary - Part 131: Circuit theory
- IEC 60050-161:1990 International elektrotechnical vocabulary; chapter 161: electromagnetic compatibility
- IEC 61967-2 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
- IEC 62132-1:2006 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC 62132-2:2010 history
- 2010 IEC 62132-2:2010 Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
