This part of IEC 62132 provides general information and definitions on measurement of
conducted and radiated electromagnetic immunity of integrated circuits (ICs) to conducted
and radiated disturbances. It also provides a description of measurement conditions, test
equipment and set-up, as well as the test procedures and content of the test reports. A test
method comparison table is included in Annex A to assist in selecting the appropriate
measurement method(s).
This standard describes general conditions required to obtain a quantitative measure of
immunity of ICs in a uniform testing environment. Critical parameters that are expected to
influence the test results are described. Deviations from this standard are noted explicitly in
the individual test report. The measurement results can be used for comparison or other
purposes.
Measurement of the injected voltages and currents, together with the responses of the ICs
tested at controlled conditions, yields information about the potential immunity of the IC to
conducted and radiated RF disturbances in a given application.
IEC 62132-1:2006 history
2015IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
2006IEC 62132-1:2006 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions