GB/T 5238-2009 (English Version) PDF

Standard No.: GB/T 5238-2009
Language: Chinese, Available in English version
Release Date: 2009
Published By: General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Status: Be replaced 2020-05
Replace By: GB/T 5238-2019
Latest: GB/T 5238-2019
Replace: GB/T 5238-1995 GB/T 15713-1995

Scope: This standard specifies the requirements, test methods, inspection rules and signs, packaging, transportation, storage, and order form for germanium single crystals and germanium single wafers. This standard applies to germanium single crystals and germanium single wafers used in the manufacture of semiconductor devices, lasers, epitaxial substrates, etc.

GB/T 5238-2009 Referenced Document

GB/T 1550 Test methods for conductivity type of extrinsic semiconducting materials*， 2018-12-28 Update
GB/T 1552 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array
GB/T 1553 Determination of Minority Carrier Lifetime in Silicon and Germanium by Photoconductivity Decay Method*， 2023-08-06 Update
GB/T 2828.1 Inspection procedure by count sampling part 1: Lot by lot inspection sampling plan retrieved by acceptance quality limit (AQL)*， 2013-02-15 Update
GB/T 5252 Test method for dislocation density of monocrystal germanium*， 2020-06-02 Update

2019 GB/T 5238-2019 Monocrystalline germanium and monocrystalline germanium slices
2009 GB/T 5238-2009 Monocrystalline germanium and monocrystalline germanium slices
1995 GB/T 5238-1995 Monocrystalline germanium

GB/T 5238-2009 Monocrystalline germanium and monocrystalline germanium slices has been changed from GB/T 15713-1995 Monocrystalline germanium slices.