ASTM F1262M-95(2008)
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

Standard No.

ASTM F1262M-95(2008)

Release Date

1995

Published By

American Society for Testing and Materials (ASTM)

Status

Be replaced

Replace By

ASTM F1262M-14

Latest

ASTM F1262M-14

Scope

Digital logic circuits are used in system applications where they are exposed to pulses of radiation. It is important to know the minimum radiation level at which transient failures can be induced, since this affects system operation.

1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 10³ Gy (Si)/s.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ASTM F1262M-95(2008) history

• 2014 ASTM F1262M-14 Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
• 1995 ASTM F1262M-95(2008) Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
• 1995 ASTM F1262M-95(2002) Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
• 1995 ASTM F1262M-95 Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits