ASTM F1262M-14 PDF

Scope: 5.1 Digital logic circuits are used in system applications where they are exposed to pulses of radiation. It is important to know the minimum radiation level at which transient failures can be induced, since this affects system operation.

1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 10³ Gy (matl.)/s.

1.1.1 Discussion—This document is intended to be a guide to determine upset threshold, and is not intended to be a stand-alone document.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ASTM F1262M-14 Referenced Document

ASTM E666 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
ASTM E668 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices*， 2020-07-01 Update
ASTM F1893 Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices

2014 ASTM F1262M-14 Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
1995 ASTM F1262M-95(2008) Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
1995 ASTM F1262M-95(2002) Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
1995 ASTM F1262M-95 Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits