JIS C 2570-2:2008
Directly heated negative temperature coefficient thermistors -- Part 2: Sectional specification -- Surface mount negative temperature coefficient thermistors

Standard No.

JIS C 2570-2:2008

Release Date

2008

Published By

Japanese Industrial Standards Committee (JISC)

Status

Withdraw

Replace By

JIS C 2570-2:2015

Latest

JIS C 2570-2:2015

Scope

This standard primarily specifies surface-mounted NTC thermistors made from transition metal oxides with semiconducting properties.

JIS C 2570-2:2008 Referenced Document

• JIS C 0025:1988 Basic environmental testing procedures Part 2: Tests Test N: Change of temperature
• JIS C 2570-1:2006 Directly heated negative temperature coefficient thermistors -- Part 1: Generic specification
• JIS C 60068-2-2:1995 Basic environmental testing procedures Part 2: Tests, Test B: Dry heat
• JIS C 60068-2-30:1988 Basic environmental testing procedures Part 2: Tests Test Db: Damp heat, cyclic (12 + 12-Hour cycle)
• JIS C 60068-2-58:2006 Environmental testing -- Part 2: Tests -- Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
• JIS C 60068-2-78:2004 Environmental testing -- Part 2-78: Tests -- Test Cab: Damp heat, steady state

JIS C 2570-2:2008 history

• 2021 JIS C 2570-2:2021 Directly heated negative temperature coefficient thermistors -- Part 2: Sectional specification -- Surface mount negative temperature coefficient thermistors
• 2015 JIS C 2570-2:2015 Directly heated negative temperature coefficient thermistors -- Part 2: Sectional specification -- Surface mount negative temperature coefficient thermistors
• 2008 JIS C 2570-2:2008 Directly heated negative temperature coefficient thermistors -- Part 2: Sectional specification -- Surface mount negative temperature coefficient thermistors