IEC 60747-5-5:2007
Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

Standard No.

IEC 60747-5-5:2007

Release Date

2007

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced

Replace By

IEC 60747-5-5:2013

Latest

IEC 60747-5-5:2020

Replace

IEC 47E/332/FDIS:2007 IEC 60747-5-1:1997 IEC 60747-5-1 AMD 1:2001 IEC 60747-5-1 AMD 2:2002 IEC 60747-5-1 Edition 1.2:2002 IEC 60747-5-2:1997 IEC 60747-5-2 AMD 1:2002 IEC 60747-5-3:1997 IEC 60747-5-3 AMD 1:2002

Scope

This part of IEC 60747 gives the terminology，essential ratings，cha racteristics，safety tests as well as the measuring methods for photocouplers(or optocouplers)． NOTE The word“optocoupler”can also be used instead of“photocoupler”

IEC 60747-5-5:2007 Referenced Document

• IEC 60065:2001 Audio, video and similar electronic apparatus - Safety requirements
• IEC 60068-1:1988 Environmental testing. Part 1: General and guidance
• IEC 60068-2-14:1984 Basic environmental testing procedures. Part 2 : Tests. Test N: Change of temperature
• IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2: Tests - Test Q: Sealing
• IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
• IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
• IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
• IEC 60068-2-58:2005 Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
• IEC 60068-2-6 Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)*， 2007-12-01 Update
• IEC 60068-2-78:2001 Environmental testing - Part 2-78: Tests; Test Cab: Damp heat, steady state
• IEC 60112:2003 Method for the determination of the proof and the comparative tracking indices of solid insulating materials
• IEC 60216-1:2001 Electrical insulating materials - Properties of thermal endurance - Part 1: Ageing procedures and evaluation of test results
• IEC 60216-2:2005 Electrical insulating materials - Thermal endurance properties - Part 2: Determination of thermal endurance properties of electrical insulating materials - Choice of test criteria

IEC 60747-5-5:2007 history

• 2020 IEC 60747-5-5:2020 Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers
• 2013 IEC 60747-5-5:2007/AMD1:2013 Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
• 2013 IEC 60747-5-5:2013 Semiconductor devices.Discrete devices.Part 5-5: Optoelectronic devices.Photocouplers
• 2007 IEC 60747-5-5:2007 Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

IEC 60747-5-5:2007 Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers has been changed from IEC 60747-5-1:1997 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General.

IEC 60747-5-5:2007 Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers has been changed from IEC 60747-5-2:1997 Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics.

IEC 60747-5-5:2007 Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers has been changed from IEC 60747-5-3:1997 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods.