GB/T 20229-2006
Gallium phosphide signle crystal (English Version)
- Standard No.
- GB/T 20229-2006
- Language
- Chinese, Available in English version
- Release Date
- 2006
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Status
- 2022-10
- Replace By
- GB/T 20229-2022
- Latest
- GB/T 20229-2022
- Scope
- This standard specifies the grades, technical requirements, test methods, inspection rules, signs, packaging, transportation, storage, etc. of non-doped, S-doped, and Te-doped n-type gallium phosphide single crystal ingots and single wafers. This standard applies to gallium phosphide single crystal materials (hereinafter referred to as single crystals) prepared by the high-pressure liquid seal Czochralski method (HP-LEC).
GB/T 20229-2006 Referenced Document
- GB/T 1550 Test methods for conductivity type of extrinsic semiconducting materials*， 2018-12-28 Update
- GB/T 1555 Method for Determination of Crystalline Orientation of Semiconductor Single Crystal*， 2023-08-06 Update
- GB/T 4326 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient*， 2006-07-18 Update
- GB/T 6618 Test method for thickness and total thickness variation of silicon slices*， 2009-10-30 Update
- GJB 3076 Gallium Phosphide Single Chip Specification
GB/T 20229-2006 history
- 2022 GB/T 20229-2022 Gallium phosphide single crystal
- 2006 GB/T 20229-2006 Gallium phosphide signle crystal
