GB/T 20229-2022
Gallium phosphide single crystal (English Version)
- Standard No.
- GB/T 20229-2022
- Language
- Chinese, Available in English version
- Release Date
- 2022
- Published By
- 国家市场监督管理总局、中国国家标准化管理委员会
- Latest
- GB/T 20229-2022
- Replace
- GB/T 20229-2006
- Scope
- This document specifies the brand name, technical requirements, test methods, inspection rules, marking, packaging, transportation, storage, accompanying documents and order form of gallium phosphide single crystal. This document is applicable to the production of gallium phosphide single crystal ingots and gallium phosphide single crystal grinding sheets for optoelectronic, microelectronic and acousto-optic devices.
GB/T 20229-2022 Referenced Document
- GB/T 14264 Semiconductor materials-Terms and definitions
- GB/T 14844 Designations of semiconductor materials
- GB/T 1555 Method for Determination of Crystalline Orientation of Semiconductor Single Crystal*， 2023-08-06 Update
- GB/T 2828.1-2012 Inspection procedure by count sampling part 1: Lot by lot inspection sampling plan retrieved by acceptance quality limit (AQL)
- GB/T 4326 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient
- GB/T 6618 Test method for thickness and total thickness variation of silicon slices
- GB/T 6620 Test method for measuring warp on silicon slices by noncontact scanning
- GB/T 6621 Testing methods for surface flatness of silicon slices
- GB/T 6624 Standard method for measuring the surface quality of polished silicon slices by visual inspection
GB/T 20229-2022 history
- 2022 GB/T 20229-2022 Gallium phosphide single crystal
- 2006 GB/T 20229-2006 Gallium phosphide signle crystal
