GJB 762.1-1989
Semiconductor device radiation hardening test method Neutron irradiation test (English Version)
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GJB 762.1-1989
Standard No.
GJB 762.1-1989
Language
Chinese,
Available in English version
Release Date
1989
Published By
Military Standard of the People's Republic of China-General Armament Department
Status
Be replaced
2019-03
Replace By
GJB 762.1A-2018
Latest
GJB 762.1A-2018
GJB 762.1-1989 history
2018
GJB 762.1A-2018
Test methods for radiation hardening of semiconductor devices Part 1: Neutron irradiation test
1989
GJB 762.1-1989
Semiconductor device radiation hardening test method Neutron irradiation test
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