GJB 762.1A-2018
Test methods for radiation hardening of semiconductor devices Part 1: Neutron irradiation test (English Version)

Standard No.

GJB 762.1A-2018

Language

Chinese, Available in English version

Release Date

2018

Published By

Military Standard of the People's Republic of China-General Armament Department

Latest

GJB 762.1A-2018

GJB 762.1A-2018 history

• 2018 GJB 762.1A-2018 Test methods for radiation hardening of semiconductor devices Part 1: Neutron irradiation test
• 1989 GJB 762.1-1989 Semiconductor device radiation hardening test method Neutron irradiation test